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Publications tagged with this subject: 19

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1. Terahertz detector for imaging in 180-nm standard CMOS process

2. Analytical Subthreshold Current and Subthreshold Swing Models for a Fully Depleted (FD) Recessed-Source/Drain (Re-S/D) SOI MOSFET with Back-Gate Control

3. Ultra-low-Voltage Integrable Electronic Realization of Integer- and Fractional-Order Liao’s Chaotic Delayed Neuron Model

4. Effect of RF sputtering power on morphological and electrical properties of calcium copper titanate thin films

5. Total ionizing dose effect of gamma rays on H-gate PDSOI MOS devices at different dose rates

6. Comparative analysis of CMOS circuits of a thermometer-to-binary encoder for integrated flash analog-to-digital converters

7. Radiation-Induced Fault Simulation of SOI/SOS CMOS LSI’s Using Universal Rad-SPICE MOSFET Model

8. Simulation of the potential distribution in an inhomogeneously doped workspace of a double-gate SOI CMOS nanotransistor

9. Design and analysis of high Transconductance Current Follower Transconductance Amplifier (CFTA) and its applications

10. Influence of Temperature in Scattered SiNW MOSFET

11. Investigation of interface property in Al/SiO2/n-SiC structure with thin gate oxide by illumination

12. Electro-plasmonic Modal Power Shifting in Metal/Insulator/Semiconductor Structure Tailored as a CMOS-compatible Plasmonic Waveguide

13. In Situ Analysis of Oxygen Vacancies and Band Alignment in HfO2/TiN Structure for CMOS Applications

14. Integration of functional elements of resistive nonvolative memory with 1T-1R topology

15. Modeling and simulation of carbon nanotube-based dual-gated enzyme field effect transistor for acetylcholine detection

16. Modeling of radiation-induced charge trapping in MOS devices under ionizing irradiation

17. Development of noise model for InAsSb MOSFETs and their application in low noise amplifiers

18. Interface Trap Profiles in 4H- and 6H-SiC MOS Capacitors with Nitrogen- and Phosphorus-Doped Gate Oxides

19. Computational Analysis of Carrier Mass Under Energetic Photons in Accumulation Layers of MOSFET Devices


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